The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
Feb. 18, 2022
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Hideaki Katsu, Kyoto, JP;
Hiromasa Maruno, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/453 (2006.01); G01N 21/35 (2014.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4535 (2013.01); G01J 3/021 (2013.01); G01J 3/0202 (2013.01); G01N 21/35 (2013.01);
Abstract
A Fourier transform infrared spectrophotometer includes a main interferometer, a control interferometer, an infrared detector, a control light detector, a waveplate, and a support member. The waveplate is disposed on an optical path of a control light beam and between a fixed mirror or a moving mirror and a beam splitter. The support member supports the waveplate. An outer perimeter of the waveplate includes a supported region supported by the support member and a released region spaced apart from the support member.