The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Jun. 13, 2019
Applicant:

Dow Global Technologies Llc, Midland, MI (US);

Inventors:

Kyle E. Hart, Manvel, TX (US);

Mehmet Demirors, Pearland, TX (US);

Timothy W. Gambrel, Lake Jackson, TX (US);

Philip P. Fontaine, Pearland, TX (US);

Pradeep Jain, Missouri City, TX (US);

Assignee:

Dow Global Technologies LLC, Midland, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08F 210/16 (2006.01); C08L 23/12 (2006.01); C08F 2/00 (2006.01); C08F 2/01 (2006.01); C08F 210/14 (2006.01); C08F 4/64 (2006.01); C08F 4/655 (2006.01); C08F 4/659 (2006.01);
U.S. Cl.
CPC ...
C08L 23/12 (2013.01); C08F 2/001 (2013.01); C08F 2/01 (2013.01); C08F 210/14 (2013.01); C08F 210/16 (2013.01); C08F 4/64193 (2013.01); C08F 4/6555 (2013.01); C08F 4/65904 (2013.01); C08F 2500/05 (2013.01); C08F 2500/10 (2013.01); C08F 2500/12 (2013.01); C08L 2203/16 (2013.01); C08L 2205/02 (2013.01); C08L 2207/062 (2013.01); C08L 2207/066 (2013.01);
Abstract

A bimodal ethylene-based polymer, including a high density fraction (HDF) from 3.0% to 25.0%, wherein the high density fraction is measured by crystallization elution fractionation (CEF) integration at temperatures from 93° C. to 119° C., an I/Iratio from 5.5 to 7.5, wherein Iis the melt index when measured according to ASTM D 1238 at a load of 2.16 kg and temperature of 190° C. and Iis the melt index when measured according to ASTM D 1238 at a load of 10 kg and temperature of 190° C., and a short chain branching distribution (SCBD) less than or equal to 10° C., wherein the short chain branching distribution is measured by CEF full width at half height.


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