The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Aug. 21, 2018
Applicant:

Hitachi High-tech Science Corporation, Tokyo, JP;

Inventors:

Atsuki Morisaki, Tokyo, JP;

Koji Yamamoto, Tokyo, JP;

Masahito Ito, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 7/00 (2006.01); G01N 1/30 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
B01L 7/00 (2013.01); G01N 1/30 (2013.01); G01N 35/00 (2013.01); B01L 2200/02 (2013.01); B01L 2300/041 (2013.01); B01L 2300/0858 (2013.01); B01L 2300/1805 (2013.01); B01L 2400/0475 (2013.01); G01N 35/00584 (2013.01); G01N 2035/00356 (2013.01);
Abstract

A thermostatic apparatus thermostatically holds a sample container holding a sample. The thermostatic apparatus includes a sample rack which accommodates and holds a plurality of the sample containers and is attachable to and detachable from the thermostatic apparatus; and a heat conduction member which is controlled to a constant temperature and transfers heat to the sample container, in which an opening portion is formed in the sample rack, and when the sample rack is mounted on the thermostatic apparatus, a contact portion forming one part of the heat conduction member directly contacts the sample container by passing through the opening portion, or directly contacts the sample container protruding from the opening portion.


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