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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11872015 B1

PDFFull Text
Date of Patent:
Jan. 16, 2024

Filed:

Jan. 18, 2021

Apparatus and method for confocal microscopy using dispersed structured illumination

Applicant:

Cylite Pty Ltd, Notting Hill, AU;

Inventor:

Steven James Frisken, Vaucluse, AU;

Assignee:

Cylite Pty Ltd, Notting Hill, AU;

Attorney:

MATTINGLY & MALUR, PC

Primary Examiner:

Uzma Alam

Assistant Examiner:

Jonathon Cook

Int. Cl.
CPC ...
G01J 3/447 (2006.01); A61B 5/00 (2006.01); A61B 3/10 (2006.01); G02B 27/00 (2006.01); A61B 3/00 (2006.01); G02B 21/00 (2006.01); A61B 3/18 (2006.01); G01J 3/02 (2006.01); A61B 3/12 (2006.01); G01N 21/47 (2006.01); G02B 3/00 (2006.01); G02B 27/10 (2006.01); G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0066 (2013.01); A61B 3/00 (2013.01); A61B 3/102 (2013.01); A61B 3/1025 (2013.01); A61B 3/1225 (2013.01); A61B 3/18 (2013.01); A61B 5/0068 (2013.01); G01J 3/0224 (2013.01); G01J 3/447 (2013.01); G01N 21/4795 (2013.01); G02B 21/0064 (2013.01); G02B 27/00 (2013.01); G02B 3/005 (2013.01); G02B 27/1086 (2013.01); G02B 2005/1804 (2013.01);
Abstract

Methods and apparatus are presented for confocal microscopy using dispersed structured illumination. In certain embodiments the apparatus also comprises an optical coherence tomography (OCT) system, and OCT images acquired from two or more regions of a sample are registered using a corresponding set of two or more larger area images acquired with the confocal microscopy system. In preferred embodiments the apparatus is suitable for analysing the retina of an eye. The confocal microscopy system can be operated in a purely intensity mode or in a coherent mode. In other embodiments a confocal microscopy system using dispersed structured illumination is utilised for surface metrology.

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