The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Sep. 24, 2021
Applicant:

Nidek Co., Ltd., Aichi, JP;

Inventors:

Taeko Horino, Aichi, JP;

Hirohisa Terabe, Aichi, JP;

Jouji Seko, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/036 (2006.01);
U.S. Cl.
CPC ...
A61B 3/036 (2013.01);
Abstract

A subjective optometry system includes a plurality of subjective optometry devices and a database which stores at least any data of objective measurement data and previous glass data in association with each identifier. Each of the subjective optometry devices includes a calibration optical system, an information processor, and a reader which is connected to the information processor, reads an identifier prepared for each examinee, and outputs information about the read identifier to the information processor. The information processor acquires at least one of the objective measurement data and the previous glass data corresponding to the identifier from the database based on the identifier received from the reader, and sets an initial value of the calibration optical system used on an occasion of subjectively measuring optical characteristics of a subject eye based on at least one of the objective measurement data and the previous glass data.


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