The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Dec. 01, 2020
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Koji Matsumoto, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/06 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 1/0638 (2013.01); A61B 1/00006 (2013.01); A61B 1/000094 (2022.02); A61B 1/0605 (2022.02);
Abstract

An endoscope system includes: an illumination portion that includes a light source and that is configured to radiate an illumination light beam having a spatially nonuniform intensity distribution onto an imaging subject; a first imager and a second imager disposed at positions that are different from each other and configured to respectively acquire a first illumination image and a second illumination image of the imaging subject being illuminated with the illumination light beam; and at least one processor configured to: create a first deep-layer image and a first surface-layer image from the first illumination image and create a second deep-layer image and a second surface-layer image from the second illumination image; and create a combined deep-layer image by combining the first deep-layer image and the second deep-layer image on the basis of pixel values of the first and second surface-layer images.


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