The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Jul. 01, 2022
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventor:

Hsuan-Li Lin, Hsin-Chu, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/0654 (2022.01); H04W 76/15 (2018.01); H04B 7/06 (2006.01); H04W 24/08 (2009.01); H04W 74/08 (2009.01); H04W 88/06 (2009.01);
U.S. Cl.
CPC ...
H04L 41/0654 (2013.01); H04B 7/0617 (2013.01); H04W 24/08 (2013.01); H04W 74/0833 (2013.01); H04W 76/15 (2018.02); H04W 88/06 (2013.01);
Abstract

A method of performing beam failure recovery (BFR) procedure in primary cell and secondary cells with reduced UE complexity is proposed. A UE is configured to operate in one or multiple frequency bands under carrier aggregation or dual connectivity. The UE performs beam failure recovery (BFR) procedure on one serving cell for one frequency band across FR1 and FR2. The serving cell is an active serving cell including both primary cell (PCell) and secondary cells (SCells). Specifically, for SCell BFR procedure, a sharing factor K is introduced when multiple SCells are configured to perform BFR procedure. In one embodiment, the SCell BFR evaluation period equals to a predefined PCell BFR evaluation period times the sharing factor K.


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