The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Jan. 22, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Young San Kang, Yongin-si, KR;

Byoung Sul Kim, Suwon-si, KR;

Soo-Hyung Kim, Hwaseong-si, KR;

Jun-Ho Jo, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); G11C 7/22 (2006.01); H04L 1/16 (2023.01); G11C 7/14 (2006.01); H04L 1/1607 (2023.01);
U.S. Cl.
CPC ...
H04L 1/0042 (2013.01); G11C 7/14 (2013.01); G11C 7/22 (2013.01); H04L 1/0045 (2013.01); H04L 1/1678 (2013.01);
Abstract

A signal receiving device includes a sampling device configured to sample an input signal to output a plurality of sampling values, and an output circuit configured to output data based on the sampling values. The output circuit outputs the data by performing majority voting based on first to third sampling values of the sampling values in response to a first control signal, and outputs the data and first and second error count signals based on the first sampling value and fourth and fifth sampling values of the sampling values in response to a second control signal. The first error count signal is generated by comparing the first sampling value sampled under a reference condition with the fourth sampling value sampled under a first offset condition, and the second error count signal is generated by comparing the first sampling value with the fifth sampling value sampled under a second offset condition.


Find Patent Forward Citations

Loading…