The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Nov. 11, 2021
Cypress Semiconductor Corporation, San Jose, CA (US);
Senwen Kan, Austin, TX (US);
Andrew Payne, Austin, TX (US);
Jeffrey W Gossett, Bothell, WA (US);
Michael Joseph Pluhta, Seattle, WA (US);
Richard A Rodell, Jr., Eagan, MN (US);
Bjarni Benjaminsson, Seattle, WA (US);
Cypress Semiconductor Corporation, San Jose, CA (US);
Abstract
A system and method for centrally logging and aggregating miscompares on chip during a memory test. The method includes performing, by a built-in self-test (BIST) unit of a memory device, a memory test on one or more memory banks of the memory device using a first algorithm. The method includes generating miscompare results responsive to performing the memory test on the one or more memory banks of the memory device. The method includes determining failure diagnostic information based on the miscompare results. The method includes generating an error packet comprising the failure diagnostic information and the miscompare results. The method includes placing the error packet in a queue of a plurality of error packets to generate a queued error packet.