The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Sep. 03, 2020
Technische Universiteit Delft, Delft, NL;
Mottaqiallah Taouil, Delft, NL;
Said Hamdioui, Delft, NL;
Technische Universiteit Delft, Delft, NL;
Abstract
Method for testing an integrated circuit device, by defect modelling of the integrated circuit device, fault modelling of the integrated circuit device based on the information obtained from the defect modelling, test development based on information obtained from the fault modelling, and executing the test on the integrated circuit device. Defect modelling of the integrated circuit device including executing a physical defect analysis of the integrated circuit device to provide a set of effective technology parameters modified from a set of defect-free technology parameters associated with the integrated circuit device, and executing an electrical modelling of the integrated circuit device using the set of effective technology parameters to provide a defect-parametrized electrical model based on a defect-free electrical model of the integrated circuit device. The present methods allow parts-per-billion testing capabilities.