The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Sep. 06, 2022
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;
Daisuke Watanabe, Yokohama Kanagawa, JP;
Takuya Maeda, Kawasaki Kanagawa, JP;
Masaya Ohtake, Fujisawa Kanagawa, JP;
Takeshi Sudo, Yokohama Kanagawa, JP;
Ryuichi Sato, Kawasaki Kanagawa, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;
Abstract
According to one embodiment, a read and write (RW) parameter adjustment method includes changing conditions of RW parameters to determine a capacity and characteristics for each of various heads of a test device to measure the characteristics and creating, for each of the heads, a database in which the measured characteristics are registered, and changing the conditions of the RW parameters for each of heads of a device to be adjusted to measure characteristics, searching the database created for each of the heads for a database having similar characteristics, and setting the capacity and characteristics in an appropriate balance based on the similar characteristics of the database obtained by the searching.