The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Aug. 14, 2020
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Rahul Gupta, Waltham, MA (US);

Jwala Dhamala, Boston, MA (US);

Melanie C B Gens, Seattle, WA (US);

Sachin Midha, Bothell, WA (US);

Jennifer Yuen, Seattle, WA (US);

Dewan Muhammed Ibtesham, Redmond, WA (US);

Wael Hamza, Yorktown Heights, NY (US);

Xinhong Zhang, Mercer Island, WA (US);

Md Humayun Arafat, Bellevue, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 15/183 (2013.01); G10L 15/06 (2013.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G10L 15/183 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G10L 15/063 (2013.01);
Abstract

Techniques for tuning parameters for machine learning models are described. Different values for a parameter are tested to determine the value that results in an optimized model. A parameter value may be selected for testing using a search algorithm based on how the model performs with respect to other values for the parameter. Different values may be tested until a stopping criterion (such as time for testing, number of trials, amount of enhancement in performance, etc.) is met. In some embodiments, the techniques may be used to determine parameter values for natural language processing models.


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