The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Dec. 16, 2022
Applicant:

Rohm Co., Ltd., Kyoto, JP;

Inventors:

Akira Hashimoto, Kyoto, JP;

Takateru Yamamoto, Kyoto, JP;

Sukenori Ito, Kyoto, JP;

Yasunobu Inoue, Kyoto, JP;

Assignee:

Rohm Co., Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/36 (2006.01); G02F 1/133 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3696 (2013.01); G09G 2330/12 (2013.01); G09G 2380/10 (2013.01);
Abstract

An abnormality detection circuit includes: a plurality of voltage dividing circuits; a first selector configured to select and output one of a plurality of outputs of the plurality of voltage dividing circuits; a first comparator configured to compare an output of the first selector with a reference voltage; and a first detector configured to detect an abnormality based on an output of the first comparator, wherein the selection of the first selector is switched in synchronization with a vertical synchronization signal or a horizontal synchronization signal of a liquid crystal display device.


Find Patent Forward Citations

Loading…