The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Feb. 23, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Sohichiro Nakamura, Ashigarakami-gun, JP;

Sho Onozawa, Ashigarakami-gun, JP;

Ryusuke Osaki, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/62 (2017.01); C12Q 1/02 (2006.01); G01N 21/45 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); C12Q 1/02 (2013.01); G01N 21/453 (2013.01); G06F 17/18 (2013.01); G06T 7/62 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/30024 (2013.01);
Abstract

A determination method of non-destructively and easily determining a state of an aggregate of a plurality of cells formed by three-dimensional culture is provided. A determination method according to the disclosed technology includes generating a phase difference image of an aggregate of a plurality of cells from a hologram obtained by imaging the aggregate, deriving a first index value that indicates a randomness of an array of a phase difference amount in a plurality of pixels constituting the phase difference image, and determining a state of the cells constituting the aggregate on the basis of the first index value.


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