The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Mar. 05, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shigeo Suzuki, Tokyo, JP;

Taisuke Tanabe, Tokyo, JP;

Hiroshi Matsumoto, Tokyo, JP;

Takanori Shigeta, Tokyo, JP;

Junichi Abe, Tokyo, JP;

Akira Tsuji, Tokyo, JP;

Yoshimasa Ono, Tokyo, JP;

Jiro Abe, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01S 17/86 (2020.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01S 17/42 (2013.01); G01S 17/86 (2020.01); G06T 2207/30108 (2013.01);
Abstract

An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatusaccording to the present disclosure includes an acquisition unitconfigured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus, and a photograph image of the object obtained by photographing the object by using a photographing apparatus, a display unitconfigured to display the point group data and the photograph image on a predetermined screen, and a control unitconfigured to control the point group data and the photograph image to be displayed in the display unit


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