The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Nov. 18, 2019
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

David Berthelot, Mountain View, CA (US);

Ian Goodfellow, Mountain View, CA (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06N 3/08 (2023.01); G06T 5/50 (2006.01); G06F 18/22 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06T 3/4046 (2013.01); G06F 18/22 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06T 3/4053 (2013.01); G06T 5/50 (2013.01);
Abstract

Methods, systems, and apparatus, including computer programs encoded on computer storage media, for training a neural network. One of the methods includes receiving a training image and a ground truth super-resolution image; processing a first training network input comprising the training image using the neural network to generate a first training super-resolution image; processing a first critic input generated from (i) the training image and (ii) the ground truth super-resolution image using a critic neural network to map the first critic input to a latent representation; processing a second critic input generated from (i) the training image and (ii) the first training super-resolution image using the critic neural network to map the second critic input to a latent representation; determining a gradient of a generator loss function that measures a distance between the latent representations of the critic inputs; and determining an update to the parameters.


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