The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Aug. 21, 2020
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Yuichi Kato, Kawasaki, JP;

Kouta Nakata, Shinagawa, JP;

Susumu Naito, Yokohama, JP;

Yasunori Taguchi, Kawasaki, JP;

Kentaro Takagi, Yokohama, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/06 (2006.01); G06N 3/08 (2023.01); G06N 5/04 (2023.01); G06F 17/18 (2006.01); G06F 17/16 (2006.01); G06N 3/063 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 17/16 (2013.01); G06F 17/18 (2013.01); G06N 3/063 (2013.01); G06N 5/04 (2013.01);
Abstract

According to an embodiment, a learning device includes a memory and one or more processors coupled to the memory. The one or more processors are configured to: generate a transformation matrix from learning data in which feature quantities and target values are held in a corresponding manner; and learn about parameters of a neural network which includes nodes equal in number to the number of rows of the transformation matrix, a first output layer representing first estimation distribution according to the values of the nodes, and a second output layer representing second estimation distribution decided according to the product of the transformation matrix and the first estimation distribution.


Find Patent Forward Citations

Loading…