The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Aug. 08, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yusuke Shimada, Tokyo, JP;

Takayuki Sasaki, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/30 (2018.01); G06F 40/205 (2020.01);
U.S. Cl.
CPC ...
G06F 8/37 (2013.01); G06F 40/205 (2020.01);
Abstract

A feature estimating device includes a parser identifying means for identifying a parser, the parser being contained in software, for parsing user input and executing a relevant command, a dividing means for extracting commands form a character string in the parser and clustering control flows connecting with the extracted commands as starting points to divide a code of the software for each feature, and a feature estimating means for estimating, based on a characteristic part of each divided code, a feature for each divided code.


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Shimada, Yusuke. (2024). Estimation of features corresponding to extracted commands used to divide code of software (U.S. Patent No. 11868744). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11868744

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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