The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Jun. 25, 2019
Nec Corporation, Tokyo, JP;
Astha Jada, Tokyo, JP;
Toshiki Kobayashi, Tokyo, JP;
Takayuki Sasaki, Tokyo, JP;
Daniele Enrico Asoni, Zurich, CH;
Adrian Perrig, Zurich, CH;
NEC CORPORATION, Tokyo, JP;
Abstract
A semiconductor device () includes: a determination unit () configured to determine whether an avoidance condition of inspection of control flow integrity is satisfied (e.g., a degree of similarity with a previous input value is in a predetermined range) based on determination auxiliary information, which is at least an input value in a target code block to be executed among a plurality of code blocks in a predetermined program, and an inspection unit () configured to avoid inspection of control flow integrity in the target code block when it is determined that the avoidance condition is satisfied.