The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Sep. 09, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Tomoya Tsuruyama, Kawasaki Kanagawa, JP;

Akihito Seki, Yokohama Kanagawa, JP;

Nao Mishima, Inagi Tokyo, JP;

Masako Kashiwagi, Ageo Saitama, JP;

Norihiko Nakamura, Kawasaki Kanagawa, JP;

Aira Hotta, Kawasaki Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/213 (2023.01); G06V 10/22 (2022.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06F 18/213 (2023.01); G06F 18/214 (2023.01); G06V 10/22 (2022.01);
Abstract

According to one embodiment, an image processing device includes first storage and a processor. The first storage is configured to store a first statistical model generated by learning bokeh which occurs in a first image. The processor is configured to acquire a second image, acquire a bokeh value which indicates bokeh occurring in the second image and an uncertainty level which indicates a level of uncertainty for the bokeh value, generate a first bokeh map based on the bokeh value and uncertainty level, and acquire a second bokeh map obtained by interpolating a bokeh value with respect to the first bokeh map. The bokeh value and the uncertainty level are output from the first statistical model by inputting the second image into the first statistical model.


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