The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Sep. 28, 2022
Applicant:

Hithink Royalflush Information Network Co., Ltd., Zhejiang, CN;

Inventors:

Zheng Yi, Hangzhou, CN;

Wei Xia, Hangzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/35 (2019.01); G06F 16/958 (2019.01); G06F 40/30 (2020.01); G06F 40/242 (2020.01); G06V 30/32 (2022.01); G06F 18/22 (2023.01); G06F 18/2411 (2023.01); G06F 18/2413 (2023.01); G06V 10/75 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06F 16/35 (2019.01); G06F 16/958 (2019.01); G06F 18/22 (2023.01); G06F 18/2411 (2023.01); G06F 18/2413 (2023.01); G06F 40/242 (2020.01); G06F 40/30 (2020.01); G06V 10/75 (2022.01); G06V 10/764 (2022.01); G06V 30/373 (2022.01);
Abstract

One aspect of the present disclosure relates to a method of sentiment analysis based on ambiguity analysis, which includes analyzing information with the sentiment analysis models and the ambiguity analysis models. Another aspect of the present disclosure relates to a method of training the sentiment analysis models and ambiguity analysis models, which includes acquiring information, constructing lexicons, conducting sentiment analysis and ambiguity analysis with said lexicons, acquiring corpus, and training models, etc. Meanwhile, another aspect of the present disclosure relates to a system of sentiment analysis, which includes input, and output modules, acquisition modules, processing modules and database.


Find Patent Forward Citations

Yi, Zheng. (2024). Method and system for sentiment analysis of information (U.S. Patent No. 11868386). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11868386

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