The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Nov. 26, 2021
Applicant:

Smart Tag Inc., Taipei, TW;

Inventor:

Kun-Chieh Chang, Taipei, TW;

Assignee:

SMART TAG INC., Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 19/0425 (2013.01); G05B 19/0421 (2013.01); G05B 2219/24204 (2013.01); G05B 2219/34465 (2013.01);
Abstract

A multi-point measurement system and a multi-point measurement method are provided. The multi-point measurement system is for measuring a device under testing and comprises a plurality of sensors and a computing device. The sensors are respectively attached to a plurality of measuring points of the device under testing. The computing device comprises a computing unit and a storage unit; the computing unit comprises a learning module, and the computing device establishes communication connections to the sensors respectively. The sensors generate original sensing data and transmit them to the storage unit for storage. The computing unit inputs processed sensing data obtained by preprocessing the original sensing data into the learning module for data analysis, and obtains a plurality of reference values corresponding to the sensors respectively. At least two adjacent sensors form a group; the computing unit sequentially inputs the processed sensing data corresponding to the sensors in the group into the learning module for a merge operation, and obtains a plurality of merged reference values corresponding to the groups respectively. The computing unit performs a determination operation using the merged reference values corresponding to each group and the reference values corresponding to the sensors in the group and generates a suitability determination for the measuring points.


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