The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Nov. 12, 2021
Applicant:

Phaidra, Inc., Seattle, WA (US);

Inventors:

Jim Jingyue Gao, Silverdale, WA (US);

Vedavyas Panneershelvam, Burnaby, CA;

Katherine Elizabeth Hoffman, Silverdale, WA (US);

Paritosh Mohan, London, GB;

Christopher R. Vause, Austin, TX (US);

Assignee:

Phaidra, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G05B 13/00 (2006.01); G06N 5/022 (2023.01);
U.S. Cl.
CPC ...
G05B 13/028 (2013.01); G05B 13/00 (2013.01); G05B 13/024 (2013.01); G06N 5/022 (2013.01);
Abstract

Methods and systems are disclosed for determining a plan to optimize key performance indicators (KPIs) of an industrial process. Such a plan is determined based on generating a query for information associated with the KPIs and based on receiving user-provided object information corresponding to the KPIs. The method includes receiving, at a user interface, one or more KPIs associated with an industrial process. The method includes generating, based on the one or more KPIs, at least one query for information associated with the KPI. The method includes receiving, at the user interface, a response to the at least one query. The method includes determining, by an artificial intelligence agent, a plan for optimizing the KPI.


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