The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

May. 07, 2021
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Mark Brenner, Asperg, DE;

Aleksej Frank, Kornwestheim, DE;

Ahmad Ramadneh, Kornwestheim, DE;

Oliver Zweigle, Stuttgart, DE;

Assignee:

FARO Technologies, Inc., Lake Mary, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 17/894 (2020.01); G01S 17/04 (2020.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/4972 (2013.01); G01S 17/04 (2020.01);
Abstract

A method for performing a simultaneous location and mapping of a scanner device includes detecting a set of lines in a point cloud, and identifying a semantic feature based on the set of lines. The method further includes assigning a first scan position of the scanner device in the surrounding environment at the present time tas a landmark, and linking the landmark with the portion of the map. The method further includes determining that the scanner device has moved, at time t, to the scan position that was marked as the landmark based on identifying said semantic feature in another scan-data. In response, a second scan position at time tis determined. Also, a displacement vector is determined for the map based on a difference between the first scan position and the second scan position. Subsequently, a revised second scan position is computed based on the displacement vector.


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