The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Apr. 09, 2020
Applicant:

Baycrest Centre for Geriatric Care, Toronto, CA;

Inventor:

Mahdi Khajehim, Toronto, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/50 (2006.01); A61B 5/055 (2006.01); G01R 33/32 (2006.01); G01R 33/385 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G01R 33/50 (2013.01); A61B 5/055 (2013.01); G01R 33/32 (2013.01); G01R 33/385 (2013.01); G06N 3/08 (2013.01);
Abstract

Magnetic resonance fingerprinting ('MRF') techniques in which T1, T2, and T2* are simultaneously quantified using a combined gradient echo and spin echo acquisition with integrated B1 correction are described. The values for T2 and T2* can be estimated separately, but using the same underlying dictionary. This approach enables a smaller dictionary size that is easily manageable, and also reduced error propagation. Moreover, by using echo planar imaging (“EPI”) readouts, the raw MRF images will have higher signal-to-noise ratio (“SNR”) relative images acquired using spiral-based MRF techniques. The EPI-based images are also relatively free of artifacts. Together, these advantages lead to the need for far fewer frames, thereby enabling much faster acquisitions. Moreover, offline reconstruction is not needed, allowing for a more straightforward implementation of MRF.


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Khajehim, Mahdi. (2024). Dual gradient echo and spin echo magnetic resonance fingerprinting for simultaneous estimation of t1, t2, and t2* with integrated b1 correction (U.S. Patent No. 11867785). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11867785

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