The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Jun. 03, 2020
Koninklijke Philips N.v., Eindhoven, NL;
Peter Boernert, Hamburg, DE;
Karsten Sommer, Hamburg, DE;
Christophe Michael Jean Schulke, Hamburg, DE;
Johan Samuel Van Den Brink, Meteren, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The invention relates to a method of MR imaging of an object () positioned in an examination volume of a MR device (). It is an object of the invention to enable efficient and high-quality non-Cartesian MR imaging, even in situations of strong Binhomogeneity. In accordance with the invention, the method comprises: —subjecting the object to an imaging sequence comprising at least one RF excitation pulse and modulated magnetic field gradients, —acquiring MR signals along at least one non-Cartesian k-space trajectory, —reconstructing an MR image from the acquired MR signals, and —detecting one or more mal-sampling artefacts caused by Binhomogeneity induced insufficient k-space sampling in the MR image using a deep learning network. Moreover, the invention relates to a MR device () and to a computer program.