The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Aug. 17, 2022
Applicant:

Zhejiang Lab, Hangzhou, CN;

Inventors:

Qiang Guo, Hangzhou, CN;

Ning Zhang, Hangzhou, CN;

Ziwen Li, Hangzhou, CN;

Zixuan Wang, Hangzhou, CN;

Mengshi Zhang, Hangzhou, CN;

Tingting Yu, Hangzhou, CN;

Assignee:

ZHEJIANG LAB, Hangzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01R 33/032 (2013.01);
Abstract

The present disclosure discloses a system and method for testing the spatial distribution uniformity of an alkali metal atom number density of an atom magnetometer. The system includes a detection laser, a laser beam expanding system, a polarizing element, a magnetic shielding system, an alkali metal atom gas chamber, a beam profile camera, a beam splitting prism, etc., which are sequentially arranged in a light advancing direction. In the method, based on an optical absorption principle, light intensity attenuations of linearly polarized light before and after passing through the alkali metal gas chamber are tested by using the beam profile camera with pixels in the level of um, a two-dimensional distribution matrix of an atom number density in space is calculated, and the distribution uniformity of the atom number density is analyzed by using a discrete coefficient.


Find Patent Forward Citations

Guo, Qiang. (2024). System and method for testing spatial distribution uniformity of alkali metal atom number density of atom magnetometer (U.S. Patent No. 11867778). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11867778

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