The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Jul. 17, 2018
Applicant:

Cornell University, Ithaca, NY (US);

Inventors:

Amit Lal, Ithaca, NY (US);

Christopher Batten, Ithaca, NY (US);

Assignee:

Cornell University, Ithaca, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/303 (2006.01); B06B 1/06 (2006.01); G01N 29/22 (2006.01); G01N 29/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/303 (2013.01); B06B 1/0622 (2013.01); G01N 29/00 (2013.01); G01N 29/22 (2013.01); G01N 29/225 (2013.01);
Abstract

A system, comprising: (i) an interposer layer; (ii) a circuit layer positioned on the interposer layer and comprising a plurality of sonically-enabled pads; and (iii) an interrogator layer positioned on the circuit layer and comprising a plurality of ultrasonic transducers configured to sonically interrogate the circuit layer; wherein the sonically-enabled pads are configured to generate an electrical signal in response to sonic interrogation from the interrogator layer, if the sonically-enabled pad is functional.


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Lal, Amit. (2024). Sonic testing method, apparatus and applications (U.S. Patent No. 11867754). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11867754

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