The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Jun. 29, 2020
Applicant:

Illinois Tool Works Inc., Glenview, IL (US);

Inventors:

Christian J. Hoehl, Dinslaken, DE;

Adrian Charles Riddick, Medfield, MA (US);

Michael Ashman, Natick, MA (US);

Nicholas Francisco Salerno, Brighton, MA (US);

Assignee:

Illinois Tool Works Inc., Glenview, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01N 3/62 (2006.01); G06T 7/50 (2017.01); G01N 3/06 (2006.01); G06T 7/60 (2017.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G01N 3/62 (2013.01); G01N 3/068 (2013.01); G06T 7/13 (2017.01); G06T 7/50 (2017.01); G06T 7/60 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30204 (2013.01);
Abstract

The present disclosure describes systems and methods to correct for perspective calibration variations of a variable thickness specimen with a single camera extensometer in a video extensometer system. In some examples, the systems and methods compensate for a change between a reference characteristic, such as a calibration plane, and an actual physical characteristic, such as a testing plane associated with a surface of a test specimen, during a testing operation. In some examples, a correction value is applied to an output (e.g., measured dimensions of the imaged test specimen) to compensate for the difference between the reference characteristic and the physical characteristic.


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