The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Aug. 04, 2020
Applicant:

Yokogawa Electric Corporation, Tokyo, JP;

Inventors:

Kazuki Setsuda, Tokyo, JP;

Hitoshi Hara, Tokyo, JP;

Yasushi Ichizawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01B 11/06 (2006.01); G01N 21/3559 (2014.01);
U.S. Cl.
CPC ...
G01N 21/86 (2013.01); G01B 11/0691 (2013.01); G01N 21/3559 (2013.01); G01N 2021/869 (2013.01); G01N 2021/8618 (2013.01); G01N 2021/8663 (2013.01);
Abstract

A measurement device to measure a physical quantity of a measurement target having a sheet-like shape is provided, including: a first integrating sphere which is separated by a gap from a first surface of the measurement target, has a first opening facing the first surface, and is not provided with a light detector to detect an intensity of light; a second integrating sphere which is separated by a gap from a second surface of the measurement target, where the second surface is positioned opposite to the first surface, and has a second opening facing the first opening with the measurement target sandwiched therebetween; a light source to emit light into the first integrating sphere; a light detecting unit to detect an intensity of light inside the second integrating sphere; and a calculating unit to calculate the physical quantity of the measurement target based on the intensity of the detected light.


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