The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Dec. 18, 2020
Applicant:

Ortho-clinical Diagnostics, Inc., Raritan, NJ (US);

Inventors:

Qi Sun, Raritan, NJ (US);

Jian Zheng, Raritan, NJ (US);

Stephen Daggett, Raritan, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/77 (2006.01); G01N 33/72 (2006.01); G02B 5/08 (2006.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G01N 21/77 (2013.01); G01N 33/726 (2013.01); G01N 33/728 (2013.01); G02B 5/0833 (2013.01); H04N 23/56 (2023.01);
Abstract

The present disclosure is directed to a thin-film element that enables analytes to be analyzed on separate surfaces. In an example, a thin-film element includes a first layer for processing a fluid sample to generate a first analyte and a second analyte. The thin-film element also includes a second layer configured to be impermeable to the first analyte to enable the first analyte to be retained by the first layer and permeable to the second analyte to enable the second analyte to pass through the second layer. The thin-film element further includes a third layer configured to retain the second analyte. The second layer includes a first reflective surface and a second reflective surface to provide reflectance signals indicative of analytes present in the first and third layers to sensors located on opposite sides of the thin-film element.


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