The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Apr. 17, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Sakuichiro Adachi, Tokyo, JP;

Takahiro Ando, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/51 (2006.01); G01N 21/49 (2006.01);
U.S. Cl.
CPC ...
G01N 21/51 (2013.01); G01N 2021/495 (2013.01);
Abstract

A sample measurement device includes: a sample container that stores a sample solution; a light source that irradiates the sample container with irradiation light from a first direction; an imaging part that captures an image of the sample solution based on light scattered by the sample solution from a second direction intersecting the first direction; and a calculator that calculates an absorbance or a concentration of the sample solution based on the image. The calculator calculates a degree of attenuation of a light amount of the image at a constant optical path length along the first direction based on the image, and calculates the absorbance or concentration of the sample solution according to the degree of attenuation.


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