The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Jan. 30, 2020
Applicant:

Bar Ilan University, Gan, IL;

Inventor:

Zeev Zalevsky, Rosh HaAyin, IL;

Assignee:

BAR ILAN UNIVERSITY, Ramat Gan, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01);
Abstract

A system for use in imaging through diffusive media is presented. The system comprising: an imaging unit comprising light source unit comprising light source(s) providing coherent illumination with selected wavelength range, and a spatial light modulator configured for selectively varying spatial pattern of wavefront of light generated by the light source(s); a collection unit comprising detector array(s) and located next to said light source unit for collecting light reflected from a sample illuminated by said light source unit. And a control system comprising processing unit(s) and connected to said light source unit and said collection unit, said control system is configured for selectively varying spatial pattern of wavefront of light generated by the light source(s) in accordance with spatial pattern of light collected by said detector array(s) of the collection unit to satisfy a reflectance condition indicative of relation between wavefront spatial pattern and collected light spatial pattern.


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