The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Nov. 17, 2021
Evident Corporation, Nagano, JP;
Yoshimasa Suzuki, Kawasaki, JP;
Toshiro Okamura, Hino, JP;
Evident Corporation, Nagano, JP;
Abstract
A refractive index distribution estimating system includes an illumination optical system configured to illuminate a sample, an imaging optical system configured to form an optical sample image, an image sensor configured to capture optical images of the sample, and a processor configured to reconstruct a refractive index distribution of the sample from images. The processor performs processing including the steps of: estimating the sample; calculating the estimated sample image from a plurality of first wavefronts emanating from a plurality of modeled light sources; optimizing a refractive index distribution of the estimated sample from a plurality of second wavefronts after the first wavefronts pass through the estimated sample, the captured image, and the image of the estimated sample; updating the estimation sample by repeating calculation of the estimated sample image and optimization of the refractive index distribution of the estimated sample; and reconstructing and outputting a structure of the estimated sample.