The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Oct. 29, 2020
Applicants:

State Grid Chongqing Electric Power Co. Electric Power Research Institute, Chongqing, CN;

State Grid Corporation of China, Beijing, CN;

Inventors:

Qiang Yao, Chongqing, CN;

Shiling Zhang, Chongqing, CN;

Yulong Miao, Chongqing, CN;

Yongtao Chen, Chongqing, CN;

Xintian Li, Chongqing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01J 3/42 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01J 3/42 (2013.01); G01N 21/39 (2013.01); G01J 2003/423 (2013.01);
Abstract

Disclosed is an optical detection system for detecting a decomposition product of a high-voltage device, including: a measurement gas chamber and a measurement host. The measurement gas chamber is disposed on the high-voltage device and is in communication with a gas chamber of the high-voltage device, a collimator and a reflector are disposed on two sides of the measurement gas chamber respectively, and the measurement host is connected to the collimator. The collimator is used for emitting measurement laser to the measurement gas chamber according to a laser signal sent by the measurement host, and receiving reflected laser from the reflector and transmitting the reflected laser to the measurement host. In the present invention, data collection and backhaul between a measurement host and a measurement gas chamber are implemented through a laser signal, thus avoiding electromagnetic interference and improving the safety of measurement for a high-voltage device.


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