The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Mar. 25, 2022
Applicant:

Trutag Technologies, Inc., Kapolei, HI (US);

Inventors:

Guocai Shu, Pleasanton, CA (US);

Alexandre Fong, Orlando, FL (US);

Assignee:

TruTag Technologies, Inc., Kapolei, HI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01N 21/35 (2013.01); G01J 3/28 (2013.01); G01J 3/2823 (2013.01); G01J 2003/2826 (2013.01); G01J 2003/2873 (2013.01); G01J 2003/2879 (2013.01); G01N 2201/127 (2013.01);
Abstract

A system includes a tunable Fabry-Perot etalon, a detector, and a processor. The tunable Fabry-Perot etalon has a settable gap. The detector measures light intensity transmitted through the tunable Fabry-Perot etalon. The processor is configured to determine the calibrated spectral measurement, wherein the calibrated spectral measurement is based at least in part on a measurement set of detected light intensities for a selected set of settable gaps and a reconstruction matrix. The reconstruction matrix is based at least in part on calibration measurements using one or more field material targets, prior stored full calibrations for each of the one or more field material targets, and the selected set of settable gaps.


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