The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Feb. 01, 2021
Southeast University, Jiangsu, CN;
Aiguo Song, Jiangsu, CN;
Shuyan Yang, Jiangsu, CN;
Baoguo Xu, Jiangsu, CN;
Yonghui Zhou, Jiangsu, CN;
Qimeng Tan, Jiangsu, CN;
Changchun Liang, Jiangsu, CN;
Ming Wei, Jiangsu, CN;
Chunhui Wang, Jiangsu, CN;
Fan Li, Jiangsu, CN;
Suinan Zhang, Jiangsu, CN;
SOUTHEAST UNIVERSITY, Jiangsu, CN;
Abstract
The present invention discloses a high-precision and miniaturized on-orbit calibration device for a six-dimensional force sensor of a space station manipulator and a calibration method thereof, which include an inverted π shape fixing bracket, three force applying devices, and a cubic stress block. Each force applying device includes a force applying head, a single axis force sensor, a force source part and a fastening part. The force source part includes an upper support plate, a second electrode plate, piezoelectric ceramic plates, a first electrode plate and a lower support plate, which are coaxially arranged sequentially from top to bottom. The single axis force sensor is mounted on the top of the upper support plate, and the hemispherical force applying head is mounted on the top of the single axis force sensor. The cubic stress block is mounted on the top of the six-dimensional force sensor.