The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Mar. 31, 2021
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Ryo Ikeuchi, Kumamoto, JP;

Takaaki Yamada, Kusatsu, JP;

Tatsuaki Kozono, Kusatsu, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 5/00 (2006.01); G01K 3/14 (2006.01); G01K 3/00 (2006.01); H02H 1/00 (2006.01); H02H 5/04 (2006.01);
U.S. Cl.
CPC ...
G01K 3/14 (2013.01); G01K 3/005 (2013.01); H02H 1/0007 (2013.01); H02H 5/04 (2013.01);
Abstract

A temperature abnormality detection system of the present invention includes a first temperature sensor that measures a first temperature indicated by a target device and a second temperature sensor that measures a second temperature indicated by ambient air around the target device. A temperature difference between the first temperature and the second temperature is calculated, and when this temperature difference becomes a predetermined threshold value or more, it is determined that a temperature abnormality of the target device has occurred.


Find Patent Forward Citations

Loading…