The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Mar. 19, 2020
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Yoshifumi Wakisaka, Musashino, JP;
Daisuke Iida, Musashino, JP;
Kunihiro Toge, Musashino, JP;
Hiroyuki Oshida, Musashino, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
It is intended to provide a phase measurement method and a signal processing device that are capable of reducing influence of noise of a measuring device without increasing the peak intensity of an incident light pulse when measuring the phase of scattered light in DAS-P. A phase measurement method according to the present invention causes wavelength-multiplexed pulse light to be incident on a measurement target optical fiber, produces a scattered light vector obtained by plotting scattered light from the measurement target optical fiber for each wavelength onto a two-dimensional plane having the in-phase component thereof on the horizontal axis and the orthogonal component thereof on the vertical axis, rotates the produced scattered light vector for each wavelength at each place in the measurement target optical fiber to align the directions of the vectors, generates a new vector by calculating the arithmetic average of the vectors having the aligned directions, and calculates the phase by using the values of the in-phase and orthogonal components of the generated new vector.