The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Jun. 17, 2022
Applicant:

Guangzhou Brillinnova Technology Co., Ltd., Guangdong, CN;

Inventors:

Linghao Cheng, Guangdong, CN;

Baiou Guan, Guangdong, CN;

Xiangjie Ma, Guangdong, CN;

Jinding Zhu, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35364 (2013.01);
Abstract

The present disclosure provides a Brillouin optical time domain reflectometer with an ultra-high spatial resolution based on bipolar differential phase encoding, including a narrow-linewidth laser, a polarization maintaining coupler, a differential encoder, a Mach-Zehnder modulator, an optical pulse amplifier, an optical circulator and a sensing fiber, an optical amplifier, a coherent optoelectronic receiver, a sideband demultiplexer, and a result measurement module. By implementing the present disclosure, a spatial resolution for measuring a Brillouin scattering spectrum can be effectively improved, and measurement precision can be effectively improved by increasing a quantity of times of superposition and averaging. In addition, measurement performance can be effectively improved by directly using a bipolar encoding sequence.


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