The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Apr. 28, 2022
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Joshua Brake, Pasadena, CA (US);
Jian Xu, Redmond, WA (US);
Changhuei Yang, South Pasadena, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02055 (2022.01); G01B 11/24 (2006.01); G01B 9/02015 (2022.01);
U.S. Cl.
CPC ...
G01B 9/02082 (2013.01); G01B 9/02024 (2013.01); G01B 11/2441 (2013.01);
Abstract
Interferometric speckle visibility spectroscopy methods, systems, and non-transitory computer readable media for recovering sample speckle field data or a speckle field pattern from an off-axis interferogram recorded by one or more sensors over an exposure time and determining sample dynamics of a sample being analyzed from speckle statistics of the speckle field data or the speckle field pattern.