The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Dec. 28, 2021
Applicant:

Mloptic Corp, Redmond, WA (US);

Inventors:

Pengfei Wu, Nanjing, CN;

Wei Zhou, Sammamish, WA (US);

Jiang He, Nanjing, CN;

Siyuan Liang, Nanjing, CN;

Assignee:

MLOptic Corp., Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/27 (2006.01);
U.S. Cl.
CPC ...
G01B 11/27 (2013.01);
Abstract

A system for calibrating an equipment, the system including a beam splitter; a first reticle configured to be removably attached to the equipment; and an image capture device including an image plane, wherein an image of the first reticle is configured to be received by way of the beam splitter at the image plane along an optical axis of the beam splitter, wherein the orientation as indicated by the first reticle is compared to an orientation of the image plane and if the orientation as indicated by the first reticle differs from the orientation of the image plane, the equipment is rotated about the optical axis of the beam splitter such that the orientation as indicated by the first reticle matches the orientation of the image plane.


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