The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

May. 03, 2018
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Ahmed Sedky, Heliopolis Cairo, EG;

Mark Bischoff, Jena, DE;

Matthias Wottke, Postbauer-Heng, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61F 9/008 (2006.01);
U.S. Cl.
CPC ...
A61F 9/00827 (2013.01); A61F 2009/0088 (2013.01); A61F 2009/00861 (2013.01); A61F 2009/00872 (2013.01); A61F 2009/00882 (2013.01); A61F 2009/00897 (2013.01);
Abstract

A planning device for generating control data, a treatment apparatus for refraction correction eye surgery and a method for generating control data for such a treatment apparatus which allows an improved subsequent refraction correction. The planning device includes a calculation processor for defining a cut surface of the cornea for post-treatment, wherein the calculation device is designed such that a change of thickness of the epithelium is taken into account in the calculation, which was caused essentially by a pretreatment.


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