The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Dec. 27, 2019
Carestream Dental Llc, Atlanta, GA (US);
Jay S. Schildkraut, Rochester, NY (US);
Jean-Marc Inglese, Bussy-Saint-Georges, FR;
Krishnamoorthy Subramanyan, Palatine, IL (US);
Vincent Loustauneau, Fontenay sous Bois, FR;
Abstract
The present disclosure describes methods for calibrating a spectral X-ray system to perform material decomposition with a single scan of an energy discriminating detector or with a single scan at each used X-ray spectrum. The methods may include material pathlengths exceeding the size of the volume reconstructable by the system. Example embodiments include physical and matching calibration phantoms. The physical calibration phantom is used to measure the attenuation of X-rays passing therethrough with all combinations of pathlengths through the calibration's basis materials. The matching digital calibration phantom is registered with the physical calibration phantom and is used to calculate the pathlength though each material for each measured attenuation value. A created data structure includes the X-ray attenuation for each X-ray spectrum or detector energy bin for all combinations of basis material pathlengths. The data structure is usable to perform a material decomposition on the X-ray projection of an imaged object.