The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Dec. 08, 2021
Koninklijke Philips N.v., Eindhoven, NL;
Nishant Singh, Son en Breugel, NL;
Klaus Jürgen Engel, Veldhoven, NL;
Johannes Wilhelmus Maria Jacobs, Boxtel, NL;
Bernd Menser, Hauset, BE;
Lester Donald Miller, Hudson, OH (US);
Fred Simon Berend Van Nijnatten, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The disclosure relates to an X-ray imaging system for acquiring two-dimensional or three-dimensional images of a subject. A relative position of an X-ray emitting region, as seen in a coordinate system which is stationary relative to an anti-scatter arrangement and/or an X-ray sensitive surface is controlled so that a first and a second image are acquired at different relative positions of the X-ray emitting region relative to the anti-scatter arrangement and/or the X-ray sensitive surface (). A data processing system of the imaging system generates an output image, based on each of the images. In the output image, artefacts generated by the anti-scatter arrangement, are reduced, suppressed or eliminated compared to the first and the second image.