The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Apr. 18, 2019
Sharp Kabushiki Kaisha, Sakai, JP;
Ryota Tomizawa, Sakai, JP;
Yoshihisa Adachi, Sakai, JP;
Yuki Edo, Sakai, JP;
Rieko Ogawa, Sakai, JP;
SHARP KABUSHIKI KAISHA, Sakai, JP;
Abstract
A possibility of extracting a signal less affected by a variation factor is increased. A data analysis device includes a data extraction unit, that extracts, as extracted data, a plurality of primary characteristic values corresponding to a plurality of extraction conditions which are different from each other and secondary characteristic values corresponding to the plurality of primary characteristic values, for each of a plurality of pieces of input data, a data identification unit that performs predetermined analysis processing on a plurality of pieces of extracted data, and identifies, based on a result of the predetermined analysis processing, analysis target data, and a data output unit that outputs output data generated based on a plurality of pieces of analysis target data.