The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Jul. 25, 2019
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Université Paris Xii Val DE Marne, Creteil, FR;

Inventors:

Guillaume Haiat, Rungis, FR;

Alexis Hubert, Alfortville, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 17/16 (2006.01); A61B 17/92 (2006.01); G01N 3/34 (2006.01); A61B 90/00 (2016.01); A61B 5/00 (2006.01); G01N 3/30 (2006.01);
U.S. Cl.
CPC ...
A61B 17/1604 (2013.01); A61B 5/4504 (2013.01); A61B 5/4509 (2013.01); A61B 5/4514 (2013.01); A61B 17/92 (2013.01); G01N 3/30 (2013.01); G01N 3/34 (2013.01); A61B 2090/064 (2016.02); A61B 2562/0252 (2013.01); G01N 2203/0039 (2013.01); G01N 2203/0076 (2013.01);
Abstract

A device for assessing the solidity of a material comprising an ancillary tool () having an end (B) in the form of a point or blade, an impactor () for striking the ancillary tool (), a sensor () and a processing unit (). The ancillary tool () is placed between a material () and the impactor () and transmits the impact force generated by the impactor () to the material (). The sensor () is capable of measuring a quantity from among the impact force and the deformation of the impactor, and of supplying a measurement signal. The processing unit () is suitable for calculating, from the measurement signal, an indicator representative of the solidity of the material (). The indicator corresponds to the duration of a time window between the first peak (P) of maximum amplitude of the measurement signal and the second peak of maximum amplitude (P).


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