The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Mar. 16, 2023
Frontier Communications Holdings, Llc, Norwalk, CT (US);
John Valdez, Copper Canyon, TX (US);
Bryan Pauling, Rochester, NY (US);
FRONTIER COMMUNICATIONS HOLDINGS, LLC, Norwalk, CT (US);
Abstract
Techniques for identifying sources of degradations within a PON include detecting that an optical profile of a segment of the PON is outside of a designated operating range, and comparing the drift over time of the segment's optical profile with respective drifts over time of optical profiles of other PON segments, each of which shares an OLT or a last mile termination unit with the segment as a common endpoint. Each segment's optical profile corresponds to characteristics of optical signals delivered over the segment (e.g., attenuation, changes in frequencies, changes in power outputs, etc.). The differences between the segments' drift(s) over time are utilized to determine the source of a degradation within the PON, and may be utilized to identify a particular component of the segment (e.g., the OLT, the last mile termination unit, or an optical fiber included in the segment) as being the source of the degradation.