The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Sep. 15, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Kevin A Gross, San Francisco, CA (US);

Wei Luo, San Jose, CA (US);

Ronan S. Kerviche, San Jose, CA (US);

Shaun M. Pacheco, Santa Clara, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/67 (2023.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01); G06T 3/40 (2006.01); G06T 7/00 (2017.01); H04N 23/80 (2023.01);
U.S. Cl.
CPC ...
H04N 23/671 (2023.01); G06T 3/4053 (2013.01); G06T 7/0002 (2013.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01); H04N 23/80 (2023.01); G06T 2207/30244 (2013.01);
Abstract

Systems and methods for characterizing a camera system on a mobile device are disclosed. Characterization of the camera system may be implemented by providing a diffraction pattern of dots at controlled, defined angles to the camera system. Images of the diffraction pattern may be captured during a focus sweep through predetermined focus positions and/or while changing the relative locations between the lens and image sensor at the predetermined focus positions. The captured images may be analyzed to determine calibration data that provides physical measurement of properties of the camera system. The calibration data may then be implemented by the camera system to produce enhanced imaging on the mobile device.


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