The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Oct. 09, 2020
Applicant:

Rakuten Symphony Singapore Pte. Ltd., Singapore, SG;

Inventors:

Shinya Kita, Tokyo, JP;

Puneet Devadiga, Tokyo, JP;

Ajay Bukan, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/50 (2022.01); H04L 43/0817 (2022.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04L 43/0817 (2013.01);
Abstract

A CI/CD assist device accepts a test template in which some of fields of test content is set to a variable field in which a value is variable. An NOS sets a value compatible with a first environment in the variable field of the test template to generate test data compatible with the first environment. A test device conducts a test on a network service in the first environment by using the test data compatible with the first environment. An NOS sets a value compatible with a second environment in the variable field of the test template to generate test data compatible with the second environment. A test device conducts a test on the network service in the second environment by using the test data compatible with the second environment.


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